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LPC3130/3131 处理器
  列清单与比较        
  部件型号 家族 制造商 内核变量 频率 Flash/ROM 封装
 LPC3131  LPC3000  NXP Semiconductors  ARM926EJ-S  180MHz  0  TFBGA180
 LPC3130  LPC3000  NXP Semiconductors  ARM926EJ-S  180MHz  0  TFBGA180
  

The Industry´s Lowest Cost ARM9 with High Speed USB 2.0 OTG Embedded designers can now take advantage of higher performance, lower cost, lower power consumption, and small footprint in applications requiring flexible USB connectivity.

Key Features:

  • 180MHz, 32-bit ARM926EJ-S Core
  • High Speed USB 2.0 OTG with On-Chip PHY
  • Up to 192KB of Internal SRAM
  • Dynamic Clock Gating and Scaling
  • NAND Flash Controller with 8-Bit ECC
  • MMC/SD/SDIO/CE-ATA Memory Card Interface
  • LCD Interface
  • Comprehensive Set of Serial Interfaces
As an innovation leader with its highly-integrated and cost-effective products, NXP Semiconductors realizes that increased performance and functionality, along with lower pricing, is a must in every design. Now, embedded designers can take advantage of higher performance, lower power consumption, and a smaller footprint in applications that require flexible USB connectivity — all at a significantly lower price point with NXP´s LPC313x microcontrollers, the industry´s lowest cost ARM9 microcontrollers with high-speed (480Mbps) USB 2.0 On-The-Go (OTG). With an extensive and enhanced feature set, the LPC313x ARM9 microcontrollers are ideal for a wide range of applications, including consumer applications such as advanced remote controls, language translators, A/V home devices, mobile and PC accessories, industrial applications such as industrial controls, factory and building automation, POS systems, bar code readers, e-Metering, security systems, Smart Cards with USB flash and power management systems, medical application such as portable diagnostics and pump and flow metering devices, automotive applications such as engine diagnostics, fleet management and in-dash audio, communications application such as I/O communication and network controllers, and instrumentation and testing applications.